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Microelectronics Device Integration Group
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Welcome
More-than-Moore (MtM) technologies are the integration of functions such as sensors and actuators, power electronics, and medical electronics with the integrated circuit. They are embedded in things the public uses every day such as automobiles, smart phones, and home appliances. In the Microelectronics Device Integration Group, we advance measurement science, develop standards, and provide calibrations and reference data for characterizing, testing, and calibrating MtM device technologies. Our personnel and facilities support industrial needs for MEMS wafer and chip-level device testing, calibrations of accelerometers and microphones, SiC power device characterization, and technologies and standards for Smart Grid. Programs/Projects
MEMS Measurement Science and Standards—The microelectronics revolution, which started in 1947 with the invention of the transistor, is epitomized in Moore's Law, which describes the steady progress in integrating ever larger numbers … Power Device and Thermal Metrology—The Power Device and Thermal Metrology Project will enable the development, commercialization and utilization of High-Voltage, High-Frequency (HV-HF) power converter technologies that will … |
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Physical Measurement Laboratory (PML) |