NIST Authors in Bold
Author(s): | Tachikawa, K.; Itoh, K.; Wada, H.; Gould, D.; Jones, H.; Walters, C. R.; Goodrich, L. F.; Ekin, J. (.; Bray, S. L.; |
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Title: | VAMAS Intercomparison of Critical Current Measurement in Nb3Sn Wires |
Published: | March 01, 1989 |
Abstract: | |
Citation: | IEEE Transactions on Magnetics |
Research Areas: | Standards |
PDF version: | Click here to retrieve PDF version of paper (442 K) |