Publication Citation

NIST Authors in Bold

Author(s): Tachikawa, K.; Itoh, K.; Wada, H.; Gould, D.; Jones, H.; Walters, C. R.; Goodrich, L. F.; Ekin, J. (.; Bray, S. L.;
Title: VAMAS Intercomparison of Critical Current Measurement in Nb3Sn Wires
Published: March 01, 1989
Abstract:
Citation: IEEE Transactions on Magnetics
Research Areas: Standards
PDF version: PDF Document Click here to retrieve PDF version of paper (442 K)