The scanning tunneling microscope (STM) is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules and aggregates on the surface. Several other recently developed scanning microscopies also use the scanning technology developed for the STM. A precursor instrument, the topografiner, was invented by Russell Young and colleagues between 1965 and 1971 at the National Bureau of Standards (NBS) [currently the National Institute of Standards and Technology (NIST)].
Contents
- For further information, contact:
- Marilyn Jacox (Marilyn.Jacox@NIST.gov)
- or
- Bill Gadzuk (Gadzuk@NIST.gov)
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| STM image, 7 nm x 7 nm, of a single zig-zag chain of Cs atoms (red) on the GaAs(110) surface (blue). |
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| STM image, 35 nm x 35 nm, of single substitutional Cr impurities (small bumps) in the Fe(001) surface. |
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