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Laser Applications Group
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Welcome
Programs/Projects
Spectral irradiance and radiance responsivity calibrations using uniform sources (SIRCUS)—SIRCUS is a reference facility for the calibration of detectors and radiometers for spectral irradiance responsivity and spectral radiance responsivity across the UV, visible, and much of the … NIST Stars—NIST Stars is an Innovations in Measurement Science project to create a catalog of stars whose top-of-the-atmosphere spectral flux has an SI traceable radiometric calibration of better than 0.5%. Lunar spectral irradiance and radiance (LUSI)—LUnar Spectral Irradiance and radiance (LUSI) is a proposed suite of instruments to radiometrically characterize the Moon for use as an on-orbit reference standard suitable for satellite … Primary optical watt radiometer (POWR)—The Optical Technology Division of NIST realizes and maintains the unit of optical power (watt) with the NIST reference cryogenic radiometer, Primary Optical Watt Radiometer (POWR). It serves as … Optical scattering from surfaces—We study how material properties, surface topography, and contaminants affect the distribution of light scattered from surfaces. Our aim is to support industry by developing standard measurement … Optical grating scatterometry—This program aims to develop standards, methods, and modeling for assessing the periodic structures using optical reflectance and transmittance measurements. STARR II—STARR II is a planned facility for the spectral and angular characterization of reflection, transmission and scattering of materials across the reflected solar wavelength spectrum (200 nm … |
Highlights
Products and Services
Contact
Laser applications group: 100 Bureau Drive, M/S 8444 |
The Laser Applications Group advances laser technology for applications in optical radiation and optical properties of materials measurements. The group uses laser technology to achieve the lowest uncertainty measurements for optical power, spectral irradiance, and spectral radiance from the ultraviolet to the infrared. We also develop laser-based optical scattering technology for the characterization of optical and semiconductor materials.