Materials Science Portal - Overview

Our objective is to develop the measurement methodology, standards and analysis necessary for the US auto industry and base metal suppliers to … more

Scientists and engineers currently have a growing library of synthetic microscale and nanoscale swimmers which affect the hydrodynamics of their … more

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Graphene, a single layer of carbon atoms, is one of the most likely materials to produce the next breakthrough in the electronics … more

In this project we are developing in situ measurements relevant to the electrochemical fabrication, processing, and application of nanostructured … more

In this project, we are developing metrology needed for the synthesis, processing, and characterization of semiconductor nanowire structures to … more

 The NCNR backscattering spectrometer is one of the highest intensity instruments of its kind. It enables very high energy resolution … more

A JEOL model 7830F field emission source, scanning Auger microscope. more

 gppois is a Bayesian tool for learning about a smooth function based on noisy measurements of its values. Users train a model of the … more

Structure refinements using a Reverse Monte Carlo (RMC) method employ large atomic ensembles to fit experimental data. The method relies on a … more

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

The OOF software provides a finite-element modeling capability to users in the field of materials science. It encapsulates advanced numerical … more