Manufacturing Programs & Projects | |
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CMOS Device and Reliability
Last Updated Date: 03/08/2013 The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS devices with sufficient reliability. … more
Xray Stress Measurement
Last Updated Date: 03/07/2013 Using X-ray diffraction techniques one can measure the full stress tensor just inside the surface of a sheet metal specimen under applied … more
Department of Homeland Security Urban Search and Rescue Robot Performance Standards
Last Updated Date: 03/06/2013 FEMA Responders often face daunting challenges during search and rescue tasks in dangerous environments. As such, the concept of including robots … more
Thin Film Electronics
Last Updated Date: 03/05/2013 The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as … more
Marciniak Multiaxial Testing
Last Updated Date: 02/24/2013 A novel method for measuring multiaxial stress-strain curves in sheet metal has been designed based on a modified Marciniak punch stretching … more
Crystal Plasticity Modeling
Last Updated Date: 02/24/2013 Crystal Plasticity Modeling calculates multiaxial mechanical constitutive behavior by treating the sample as an interacting aggregate of single … more
Cruciform Multiaxial Mechanical Testing
Last Updated Date: 02/24/2013 The cruciform mechanical test is widely used to measure the multiaxial deformation behavior of materials. Standardization of this technique would … more
MEMS Measurement Science and Standards
Last Updated Date: 02/21/2013 Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more
NIST Center for Automotive Lightweighting
Last Updated Date: 02/04/2013 Our objective is to develop the measurement methodology, standards and analysis necessary for the US auto industry and base metal suppliers to … more
Crystallographic Databases
Last Updated Date: 01/30/2013 Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more
Ceramic Phase Equilibrium Data
Last Updated Date: 01/30/2013 Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as … more
Nanoscale Stress Measurements and Standards
Last Updated Date: 01/24/2013 Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more
Nanotribology for Nanomanufacturing
Last Updated Date: 01/23/2013 Tribology is the science and technology of interacting surfaces in relative motion and includes studies of friction, adhesion, lubrication, and … more
SCORE (System, Component and Operationally Relevant Evaluations)
Last Updated Date: 01/15/2013 SCORE (System, Component and Operationally Relevant Evaluations) is a unified set of criteria and software tools for defining a performance … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |