The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
For additional information see: About the Journal
Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
Adolfas K. Gaigalas, Lili Wang, and Steven Choquette
http://dx.doi.org/10.6028/jres.118.001
Measurement of Scattering and Absorption Cross Sections of Dyed Microspheres
Adolfas K. Gaigalas, Steven Choquette, and Yu-Zhong Zhang
http://dx.doi.org/10.6028/jres.118.002
Weathering Patterns of Ignitable Liquids with the Advanced Distillation Curve Method
Thomas J. Bruno, and Samuel Allen
http://dx.doi.org/10.6028/jres.118.003
Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II)
A. Kramida
http://dx.doi.org/10.6028/jres.118.004
NIST System for Measuring the Directivity Index of Hearing Aids under Simulated Real-Ear Conditions
Randall P. Wagner
http://dx.doi.org/10.6028/jres.118.005
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