BT-7 Double Focusing Triple-Axis Spectrometer

Contact:    Yang Zhao               (301) 975-2164       Yang.Zhao@nist.gov

                  Joel Helton              (301) 975-4899     Joel.Helton@nist.gov

                 Jeff Lynn                   (301) 975-6246     Jeff.Lynn@nist.gov

Current Schedule Source Schedule Detailed Specifications Design Features Polarized Beam Operation ScanMapper Quickstart guide Recent Thermal Triple Axis Publications Access to the NCNR Facilities Monetary Assistance Programs Sample Environment DAVE (Data Analysis Software) ICE Software Proposal/BeamTime Form Photos of BT-7 BT-7 Instrument Publication BT-7 Tutorial/Summer School Information

As part of the modernization of the thermal neutron spectrometers, a new state-of-the-art thermal neutron instrument has been installed at the BT-7 thermal beam port.  There is a choice of collimations in the reactor beam that bring neutrons onto a choice of PG(002) or Cu(220)  20 cm by 20 cm double-focusing monochromators.  The sample stage incorporates an independent magnet axis in addition to the usual motorized sample orientation and rotation angles.  The analyzer and detector system is housed in a single unit on air pads.  The analyzer provides horizontal focusing capability, or it can use the crystal array coupled with a position-sensitive detector to allow the simultaneous collection of data over a range of (Q,E), or it can use a choice of different conventional collimators, all remotely and under computer control.  The analyzer/detector system is designed to be self-contained so that it can be easily interchanged with a different style of analyzer as new systems are developed.  Guide fields are incorporated throughout the instrument to enable polarized beam operation with optically-pumped He³ polarizers.  A similar spectrometer is being developed for the BT-1 beam port.

BT-7 Instrument Publication:  Please reference the following article in publications:  Double Focusing Thermal Triple Axis Spectrometer at the NCNR, J. W. Lynn, Y. Chen, S. Chang, Y. Zhao, S. Chi, W. Ratcliff, II, B. G. Ueland, and R. W. Erwin, Journal of Research of NIST 117, 61-79 (2012).

 

 

Last modified 04-January-2013 by website owner: NCNR (attn: Jeff Lynn)

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