Statistical Metrology Short Courses
Staff members of the Statistical Engineering Division regularly offer short courses on uncertainty analysis, design of experiments, and other topics in statistical metrology at NIST, at conferences open to the public, and at other government agencies. Prospective attendees of short courses at NIST include NIST scientists, engineers and technicians, industrial metrologists, staff members of other national laboratories, and metrologists from other national metrology institutes. The courses consist of lecture, discussion, and hands-on exercises designed to give users practical experience with the featured statistical methods and software tools.
Currently scheduled short courses include:
November 1, 2010 in Austin, TX
This short course is designed to provide statisticians, scientists, and engineers with the tools necessary to begin to use Bayesian inference in applied problems. Participants in the course will learn the basics of Bayesian modeling and inference using Markov chain Monte Carlo simulation with the open-source software package WinBUGS. This short course is being given as part of the 2010 ISMI Manufacturing Week.
March 14-16, 2011 in Pasadena, CA
This short course covers many aspects of the propagation of uncertainty using the methods outlined in the JCGM Guide to the Expression of Uncertainty in Measurement. Exercises and hands-on applications will use functions for uncertainty analysis from the free software package, metRology, written for the open-source R statistical computing environment. The functions will be accessed via an Excel graphical user interface that is available as a free add-in. This short course is being given as part of the 2010 Measurement Science Conference.
March 29-31, 2011 in Gaithersburg, MD
This short course covers many aspects of the propagation of uncertainty using the methods outlined in the JCGM Guide to the Expression of Uncertainty in Measurement. Exercises and hands-on applications will use functions for uncertainty analysis from the free software package, metRology, written for the open-source R statistical computing environment. The functions will be accessed via an Excel graphical user interface that is available as a free add-in.
Course notes and case studies from some past SED education and training classes are located here.
