IBPC 2012 :: Online ProceedingsMarch 5-9, 2012 National Institute of Standards and TechnologyPresentations of the International Biometric Performance Conference, 2012 This page is intended as a permanent archive of the presentations delivered to the IBPC 2012. Presentations of the International Biometric Performance Conference 2012Workshop I NFIQ2 (Zip file) Day 1 Presentations (Zip file) Day 2 Presentations (Zip file) Day 3 Presentations (Zip file) Workshop II Artefact, Liveness, Suspicious Presentation Detection (Zip File) The presentations are listed alphabetically by speaker name.
Day 2 PANEL :: Tests to Support Commerical Adoption, Tests + Standards Enable Competition. Tests of Privacy Enhancing Technologies. Tests for Certification.Jonas Anderson, A&A Marine Vision AB, Privacy in Biometric Systems. Steve Elliott, Purdue University, Biometric Testing. Cathy Tilton, Daon, Wither Certification? Day 3 PANEL :: The ISO/IEC 19795 multipart standard - Biometric Performance Testing and Reporting standardIntro : Fernando Podio, Intro Part 1: Tony Mansfield, Principles and Framework Part 2: Michael Thieme, Technology + scenario testing Part 3: Eric Kukula, Modality specific aspects Part 4: Patrick Grother, Interoperability tests Part 5: Rick Lazarick, Graded PACs tests Part 6: Tony Mansfield, Operational testing Part 7: Patrick Grother, On-card Comparison Other SC37 WG5 standards : Raul Sanchez-Reillo, ISO/IEC 29156, 29197, 29198 , and Patrick Grother, ISO/IEC 29120. Satellite Workshop I :: Technical update on the second generation NIST fingerprint Image Quality Algorithm.This workshop, which follows the IBPC 2010 session on NFIQ strategy, will present current technical work toward a revised algorithm. Goals are to inform users and to identify future direction. Elham Tabassi, NIST, NFIQ 2.0 project overview Oliver Bausinger, BSI, Motivation and use cases for NFIQ 2.0 Michael Schwaiger, Secunet, Framework, architecture, modularization Christoph Busch, Fraunhofer IGD, Technical overview of features Martin Olsen, CASED, Candidate features, computation and visualization Johannes Merkle, Secunet, Quality feature evaluation, preliminary results Timo Ruhland, BKA, AFIS quality requirements and implementations Soweon Yoon and Anil Jain, MSU, Inclusion of mutilated fingerprint detection in NFIQ 2.0? Elham Tabassi, NIST, NFIQ 2.0 developments for the next year Satellite Workshop II :: Artefact, Liveness, Suspicious Presentation Detection.This workshop is one of the first open sessions to address issues concerning biometric vulnerability. The focus will be on the concepts, terms, standards, and evaluation aspects. Elaine Newton, NIST, Editor of ISO/IEC 30107: Overview of the Current Draft International Standard 30107 on Artefact and Liveness Detection. Rick Lazarick, CSC, Co-editor of ISO/IEC 30107: Spoofs, Subversion & Suspicion: Terms and Concepts. Stephanie Schuckers, Clarkson University, and Arun Ross, West Virginia University, Error rate metrics proposed for detection of suspicious presentations to biometric authentication systems. Ralph Breithaupt, BSI, Need and perspectives to realize liveness detection. Axel Munde, BSI, How can artifact detection complement common criteria and other security assessments of authentication systems. Satellite Workshop III :: Voice Biometrics Data Standardization for Law Enforcement, Military and Homeland Security.The focus of the workshop is transmission of voice data and associated metadata for forensic analysis. This workshop will not deal with voice biometrics for applications such as access control or with features or models extracted from voice data. Handout - Investigatory Voice Biometrics Committee Report Development of a Draft Type-11 Voice Signal Record - DRAFT Brad Wing, NIST, NIST/ITL Procedures for the Development of American National Standards (ANS) Using the Canvass Method Brad Wing, NIST, The ANSI/NIST-ITL Standard Sponsors and SupportersThe workshop is organized by the Information Access Division of the Information Technology Laboratory (ITL) at the National Institute of Standards and Technology (NIST).
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