Manufacturing Programs & Projects | |
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Measuring the Height Transfer Function of Phase-Shifting Interferometers
Last Updated Date: 10/06/2011 There is an increasing need for accurate measurements of precision surfaces and optical elements over a wide range of spatial frequencies. Ripple … more
Metrology for Advanced Optics
Last Updated Date: 10/06/2011 From projecting computer chip designs onto silicon wafers to imaging remote galaxies, advanced optics are crucial to modern technology and … more
Nano-Structured Optics for Measuring Spherical Surfaces with Large Radii
Last Updated Date: 10/06/2011 The goal of this project is to solve the problem of measuring the form error and radius of spherical optical surfaces with large radius of … more
Wafer Flatness and Wafer Thickness Variation
Last Updated Date: 10/06/2011 The semiconductor industry expects continued demand for improved wafer flatness at the exposure site to avoid blurring of ever smaller circuit … more
Micrometer Level Surface Finish Metrology
Last Updated Date: 10/06/2011 Provide optical three-dimensional surface topography measurement at the micrometer level. Conventional surface topography involves contact stylus … more
Atom-Based Standards and Fabrication
Last Updated Date: 10/06/2011 A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more
Improvements in Calibrations and Uncertainty Evaluation
Last Updated Date: 10/06/2011 Effective measurement services require that ongoing research into improvements to high accuracy calibrations be continually done. This research … more
Optical Comb and Refractometry
Last Updated Date: 10/06/2011 This project will advance the realization of the meter through the use of absolute refractometry to achieve below one part in 108 accuracy. This … more
Complex Geometry Instrumentation and Standards
Last Updated Date: 10/06/2011 This project will promote innovation and a reduction of time to market by developing calibration capabilities and standards for measuring … more
MicroFeature Calibration Development
Last Updated Date: 10/06/2011 This project will develop and provide high accuracy metrology for an array of high value products in medical, aerospace, automotive, energy, and … more
MEMS Measurement Science and Standards
Last Updated Date: 10/03/2011 The microelectronics revolution, which started in 1947 with the invention of the transistor, is epitomized in Moore's Law, which describes the … more
Antenna Metrology
Last Updated Date: 02/11/2011 Antennas are the eyes, ears and voices of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on … more
International System of Units (SI)
Last Updated Date: 01/13/2011 The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more
Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010 High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more
Wireless Systems Metrology
Last Updated Date: 10/05/2010 Imagine how much safer a fire fighter's job would be if it were possible for a robot to navigate in a burning building and locate those in … more |
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