Nanotechnology Programs & Projects | |
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Atomic Force Microscope (AFM) Nanoparticle Metrology
Last Updated Date: 10/06/2011 The largest existing market for nanotechnology centers on production and use of nanoparticles and nanocomposites. The NextGen Program is … more
Metrology for Advanced Optics
Last Updated Date: 10/06/2011 From projecting computer chip designs onto silicon wafers to imaging remote galaxies, advanced optics are crucial to modern technology and … more
Nano-Structured Optics for Measuring Spherical Surfaces with Large Radii
Last Updated Date: 10/06/2011 The goal of this project is to solve the problem of measuring the form error and radius of spherical optical surfaces with large radius of … more
Atom-Based Standards and Fabrication
Last Updated Date: 10/06/2011 A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more
Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 10/03/2011 The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more
Quantum Voltage System Development and Dissemination
Last Updated Date: 10/03/2011 This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more
Quantum Sensors
Last Updated Date: 10/03/2011 The Quantum Sensors Project develops sensors based on quantum phenomena for spectroscopy, imaging, and other precision measurements for … more
Quantum Information and Measurements
Last Updated Date: 10/03/2011 America's future prosperity and security may rely in part on the exotic properties of quantum mechanics. Research on quantum information (QI) … more
MEMS Measurement Science and Standards
Last Updated Date: 10/03/2011 The microelectronics revolution, which started in 1947 with the invention of the transistor, is epitomized in Moore's Law, which describes the … more
Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011 A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more
Measuring Light-Matter Interactions in Chip-Based Optical Cavities
Last Updated Date: 08/01/2011 Measuring interactions between light and matter has both fundamental and practical importance. For example, lasers have had a profound … more
Electronic Transport in Nanoscale Organic/Inorganic Devices
Last Updated Date: 07/25/2011 Organic materials (multi-carbon compounds) are amenable to almost Lego©-like tinkering with their structure and composition, and can exhibit … more
Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010 High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more
Fabrication and Metrology of Novel Magnetic Tunnel Junctions in the Ultra-thin Barrier Limit
Last Updated Date: 10/20/2010 Magnetic tunnel junctions, nanostructured by highly charged ions, are being probed and characterized to establish the foundation for novel … more
Optical scattering from surfaces
Last Updated Date: 10/18/2010 We study how material properties, surface topography, and contaminants affect the distribution of light scattered from surfaces. Our aim is to … more |
Related Links in:Center for Nanoscale Science and TechnologyMaterial Measurement LaboratoryPhysical Measurement Laboratory
 Scanning electron microscope image of typical titania nanotubes for a photocatalytic cell to produce hydrogen gas from water. Contact
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